Products > MeasurLink 6 > Gage Management
Gage inventory
Establish calibration standard and gage inventory. Build metrology asset database. Includes, purchase price, vendor, tolerance, range, uncertainty, owner, serial number, model number, etc. Calibration procedures
Generate calibration procedures with environmental conditions, instructions, gage block sequencing, etc. Calibration recall reports
Print calibration due date or overdue report to collect gages. Can be done for specific individuals, locations, gage types or date ranges. R&R recall reports
Print Gage R&R due date or overdue report to collect gages. Can be done for specific individuals, locations, gage types or date ranges. Electronic recall to MeasurLink® SPC Real-Time
If used with Real-Time application, allows you to check out gage to specific station and tracks number of parts measured. Warn Real-Time operator when gages are becoming overdue for calibration and option to lock them out of inspection when overdue. Recall based on time, checkout cycles or actual usage. Comprehensive search
Search by any combination of Gage ID, Gage type, Manufacturer, Location, User, Due date and Status. Digital gage calibration against standards
Direct digital gage data entry from all Mitutoyo digimatic gaging and third party RS-232C devices. Laser micrometer capable for attribute gages
Use high accuracy gage to calibrate Pin gage sets, Ring gage sets, Plug gage sets, and Thread gage sets Vendor contacts
Establish vendor contact list including outsourced calibration and repair service for gage checkouts. Gage event history
Record all gage events from the time gage is put into service to the time it is retired. Gages checked out to work, storage, calibration, repair. "Smart" calendar
Establish company holiday and non-working calendar to eliminate inclusion in recall calculations. Incremental response methods
Supports Auto Calibration methods (or Reactive Methods) in which calibration interval adjustments are made in response to data from recent calibrations without any attempt to model or "predict" measurement reliability behavior over time. |
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